CMPE224: Testing Digital Circuits

*****COURSES ARE SUBJECT TO CHANGE*****

An introduction to the theory and practice of testing. Topics are chosen from fault and defect models, test generation for combinational and sequential circuits, fault simulation, scan-design and built-in self-test. Enrollment restricted to graduate students; undergraduates may enroll if they have completed Computer Science 101. T. Larrabee, F. Ferguson

5 Credits

YearFallWinterSpringSummer
2007-08
2006-07
2004-05
2002-03
1999-00

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