*****COURSES ARE SUBJECT TO CHANGE*****
An introduction to the theory and practice of testing. Topics are chosen from fault and defect models, test generation for combinational and sequential circuits, fault simulation, scan-design and built-in self-test. Enrollment restricted to graduate students; undergraduates may enroll if they have completed Computer Science 101.
5 Credits
Year | Fall | Winter | Spring | Summer |
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2007-08 |
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2006-07 |
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2004-05 |
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2002-03 |
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1999-00 |
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